Automatic Test Generation for Maximal Diagnosis of Linear Analog Circuits
نویسندگان
چکیده
A fault-based multifrequency test generation and fault diagnosis procedure is proposed in this work. The procedure selects a minimal set of test measures and generates the minimal set of frequency tests which guarantee maximum fault coverage and maximal diagnosis of circuit AC hard/soft faults. The procedure is exempli ed for several self-testable linear analog circuits.
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